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Yield-oriented evaluation methodology of network-on-chip routing implementations

Research Area: Network-On-Chip Year: 2009
Type of Publication: In Proceedings Keywords: Si;interconnect malfunction;network-on-chip routing;processor core interconnection;silicon die;yield enhancement;yield operation;yield oriented evaluation;integrated circuit interconnections;integrated circuit yield;microprocessor chips;network-on-chip;si
Authors:
Book title: System-on-Chip, 2009. SOC 2009. International Symposium on
Pages: 100 -105
Month: oct.
Abstract:
Network-on-Chip technology is gaining wide popularity for the interconnection of an increasing number of processor cores on the same silicon die. However, growing process variations cause interconnect malfunction or prevent the network from working at the intended frequency, directly impacting yield and manufacturing cost. Topology agnostic routing algorithms have the potential to tolerate process variations without degrading performance. We propose a three step methodology for evaluating routing algorithms in their ability to deal with variability. Using yield enhancement and operation speed preservation as the criteria, we demonstrate how this methodology can be used to select the best design choice among several plausible combinations of routing algorithms and implementations. Also, we show how an efficient table-less routing implementation can be used to minimise the impact of variability on manufacturing and operating frequency.
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