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On the Impact of Within-Die Process Variation in GALS-Based NoC Performance

Research Area:	Uncategorized	Year:	2012
Type of Publication:	Article
Authors:	Hernández, Carles Roca, Antoni Silla, Federico Flich, Jose Duato, Jose
Journal:	IEEE Trans. on CAD of Integrated Circuits and Systems	Volume:	31
Number:	2	Pages:	294-307
[Bibtex]